|
|||||||||||||||
|
For å registrere i Cristin må du være vitenskapelig eller administrativt ansatt.
|
|||||||||||||||
|
|||||||||||||||
|
|||||||||||||||
| Viser treff 1-29 av 29 |
|
2021
|
||
| 1. | Xue, Hui; Batalden, Bjørn-Morten; Sharma, Puneet; Johansen, Jarle André; Prasad, Dilip K.. Biosignal-Based Driving Skill Classification Using Machine Learning: A Case Study of Maritime Navigation. Applied Sciences 2021 ;Volum 11.(20) s. 1-16 UiT |
|
|
2015
|
||
| 2. | Birkelund, Yngve; Johansen, Jarle André; Hanssen, Alfred. High-precision surrogate data based tests for Gaussianity and linearity of discrete time random processes. European Signal Processing Conference 2015 ;Volum 06-10-September-2004:7079994. s. 73-76 UiT |
|
|
|
||
| 3. | Johansen, Jarle André; Edvardsen, Kåre; Sharma, Puneet; Khawaja, Hassan Abbas. Measuring the Sea Spray Flux using High-Speed Camera. The International Conference of Multiphysics; 2015-12-10 - 2015-12-11 UiT |
|
|
|
||
| 4. | Johansen, Jarle André; Hansen, Bernt Inge. Experimental results on the pressure dependence of the minnaert resonance frequency for three different gases in water. Proceedings - IEEE Ultrasonics Symposium 2015 s. - UiT |
|
|
2011
|
||
| 5. | Hansen, Bernt Inge; Johansen, Jarle André. Experimental results on the pressure dependence of the minnaert resonance frequency for nitrogen gas bubbles in water. Ultrasonics Symposium (IUS), 2011 IEEE International; 2011-10-18 - 2011-10-21 UiT |
|
|
|
||
| 6. | Hansen, Bernt Inge; Johansen, Jarle André. Experimental results on the pressure dependence of the minnaert resonance frequency for nitrogen gas bubbles in water. Proceedings - IEEE Ultrasonics Symposium 2011 s. 2053-2056 UiT |
|
|
2007
|
||
| 7. | Johansen, Jarle Andre; Qi, Peng. Model-Based Low-Frequency Noise Power Spectrum Density Fitting in SiGe HBTs. 7th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2007); 2007-01-10 - 2007-01-12 UiT |
|
|
2004
|
||
| 8. | Birkelund, Yngve; Hanssen, Alfred; Johansen, Jarle Andre. High-precision surrogate based tests for gaussianity and linearity. XII European Signal Processing Conference (EUSIPCO); 2004-09-06 - 2004-09-06 UiT |
|
|
|
||
| 9. | Birkelund, Yngve; Johansen, Jarle Andre; Hanssen, Alfred. High-precision surrogate data based tests for Gaussianity and linearity of discrete time random processes. XII European Signal Processing Conference (EUSIPCO); 2004-10-06 - 2004-10-09 UiT |
|
|
|
||
| 10. | Johansen, Jarle Andre. Lavfrekevnt støy i Silisium-Germanium transistorer. Studiemøtet Elektronikk og Data; 2004-06-17 - 2004-06-18 UiT |
|
|
|
||
| 11. | Johansen, Jarle Andre. Low-frequency Noise Characterization of Silicon-Germanium Resistors and Devices. Tromsø: Universitetet i Tromsø 2004 1 s. UiT |
|
|
|
||
| 12. | Johansen, Jarle Andre; Birkelund, Yngve; Jin, Zhenrong; Cressler, John D.. A Statistical Tool For Probing the Coupling Between Noisy Traps in Semiconductor Devices, With Application to 1/f Noise in SiGe HBTs. The 5'th topical meeting on Silicon Monolithic Integrated Circuits in RF Systems; 2004-10-08 - 2004-10-10 UiT |
|
|
|
||
| 13. | Johansen, Jarle Andre; Jin, Zhenrong; Cressler, John D.; Cui, Y; Niu, G; Liang, Q; Rieh, JS; Freeman, G; Ahlgren, D; Joseph, A. On the Scaling Limits of Low-Frequency Noise in SiGe HBTs. Solid-State Electronics 2004 ;Volum 48.(10-11) s. 1897-1900 UiT |
|
|
|
||
| 14. | Johansen, Jarle Andre; Jin, Zhenrong; Cressler, John D.; Cui, Y; Niu, G; Liang, Q; Rieh, JS; Freeman, G; Ahlgren, D; Joseph, A. On the scaling limits of low-frequency noise in SiGe HBTs. Solid-State Electronics 2004 ;Volum 48.(10-11) s. 1897-1900 UiT |
|
|
|
||
| 15. | Birkelund, Yngve; Johansen, Jarle Andre; Cressler, John D.; Jin, Zhenrong. A statistical tool for probing the coupling between noisytraps in semiconductor devices, with application to 1/f noise in SiGe HBTs. Topical Meeting on Silicon Monolitic Integrated Circuits in RF Systems (SiRF); 2004-09-08 - 2004-09-08 UiT |
|
|
|
||
| 16. | Jin, Zhenrong; Johansen, Jarle Andre; Cressler, John D.; Reed, Robert A.; Marshall, Paul W.; Joseph, Alvin J.. Using proton irradiation to probe the origins of low-frequency noise variations in SiGeHBTs. IEEE Transactions on Nuclear Science 2004 ;Volum 50.(6) s. 1816-1820 UiT |
|
|
2003
|
||
| 17. | Birkelund, Yngve; Hanssen, Alfred; Johansen, Jarle Andre; van Rheenen, Arthur D.; Cressler, John D.. Time series analysis of low-frequency noise in SiGe HBTs. Norsk symposium i signalbehandling 2003.; 2003-10-02 - 2003-10-04 UiT |
|
|
|
||
| 18. | Birkelund, Yngve; Johansen, Jarle Andre; Hanssen, Alfred; Cressler, John D.; Van Rheenen, Arthur D.. Time Series Analysis of Low-Frequency Noise in SiGe HBTs. NORSK SYMPOSIUM I SIGNALBEHANDLING 2003; 2003-10-02 - 2003-10-04 UiT |
|
|
|
||
| 19. | Jin, Zhenrong; Johansen, Jarle Andre; Cressler, John D.; Reed, Robert A.; Marshall, Paul W.; Joseph, Alvin J.. Using Proton Irradiation to Probe the Origins of Low-frequency Noise Variations in SiGe HBTs. 2003 IEEE Nuclear and Space Radiation Effects Conference; 2003-07-21 - 2003-07-25 UiT |
|
|
|
||
| 20. | Johansen, Jarle Andre; Jin, Zhenrong; Cressler, John D.; Cui, Yan; Niu, Guofu; Liang, Qingqing; Rieh, Jae-Sung; Freeman, Greg; Ahlgren, David; Joseph, Alvin J.. On the Scaling Limits of Low-Frequency Noise in SiGe HBTs. 2003 International Semiconductor Device Research Synopsium; 2003-12-10 - 2003-12-12 UiT |
|
|
|
||
| 21. | Johansen, Jarle Andre; Jin, Zhenrong; Cressler, John D.; Joseph, Alvin J.. Geometry-Dependent Low-frequency Noise Variations in 120 GHz fT SiGe HBTs. IV. Topical Meeting on Silicon Monlithic Integrated Circuits in RF Systems; 2003-04-09 - 2003-04-11 UiT |
|
|
|
||
| 22. | Zhu, Chendong; Liang, Qingqing; Al-Huq, Ragad; Cressler, John D.; Joseph, Alvin J.; Johansen, Jarle Andre; Chen, Tianbing; Niu, Guofu; Freeman, Greg; Rieh, Jae-Sung; Ahlgren, David. An Investigation of the Damage Mechanism in Impact Ionization-Induced "Mixed-Mode" Reliability Stressing of Scaled SiGe HBTs. IEEE International Electron Devices Meeting 2003; 2003-12-08 - 2003-12-10 UiT |
|
|
2001
|
||
| 23. | Chen, Xuyuan; Johansen, Jarle Andre; Liu, C. L.. Temperature dependence of low-frequency electrical noise and reliability of semiconductor lasers. Semiconductor Optoelectronic Device Manufacturing and Applications; 2001-11-07 - 2001-11-09 UiT |
|
|
|
||
| 24. | Chen, Xuyuan; Johansen, Jarle Andre; Salm, Cora; Van Rheenen, Arthur D.. On low-frequency noise of polycrystalline GeSi for sub-micron CMOS technologies. Solid-State Electronics 2001 ;Volum 45. s. 1967-1971 UiT |
|
|
|
||
| 25. | Johansen, Jarle Andre; Figenschau, Hallvar; Chen, Xuyuan; Van Rheenen, Arthur D.; Salm, Cora. Low Frequency Noise in Poly-Si- and Poly-SiGe-gated MOSFETs. 16'th International Conference on Noise in Physical Systems and 1/f Fluctuations; 2001-10-22 - 2001-10-25 UiT |
|
|
2000
|
||
| 26. | Chen, Xuyuan; Johansen, Jarle Andre; Salm, Cora; Van Rheenen, Arthur D.. On Low-Frequency Noise Of Polycrystalline GeSi For Sub-Micron CMOS Technologies. International Conference on Communications Computers & Devices; 2000-12-14 - 2000-12-16 UiT |
|
|
|
||
| 27. | Chen, Xuyuan; Johansen, Jarle Andre; Van Rheenen, Arthur D.; Salm, Cora. On the 1/f noise of polycrystalline GexSi1-x for sub-micron CMOS technologies. International conf. On Communications, Computers & Devices; 2000-12-14 - 2000-12-16 UiT |
|
|
|
||
| 28. | Chen, Xuyuan; Johansen, Jarle Andre; Van Rheenen, Arthur D.; Salm, Cora. On the 1/f noise of polycrystalline GexSi1-x for sub-micron CMOS technologies”. Solid-State Electronics 2000 UiT |
|
|
|
||
| 29. | Johansen, Jarle Andre; Chen, Xuyuan; Van Rheenen, Arthur D.. Study of low-frequency noise in polycrystaline GexSi1-x. Fysikermøtet 2000; 2000-06-16 - 2000-06-18 UiT |
|